Boletín de la Sociedad Geológica Mexicana Volumen 71, núm. 2, 2019, p. 457-479 http://dx.doi.org/10.18268/ BSGM2019v71n2a14

 Análisis multiescala de indicadores arqueológicos de Tlajinga, Teotihuacan (México). Desde la percepción remota a la microscopía 

Jorge Blancas¹, Luis Barba², David Carballo³, Elizabeth Solleiro Rebolledo⁴, Sergey Sedov⁴, Jaime Díaz⁴

 ¹Posgrado en Ciencias de la Tierra, UNAM, Laboratorio de Prospección Arqueológica, 04510 Coyoacán, CDMX, México.

²Laboratorio de Prospección Arqueológica, UNAM, 04510 Coyoacán, CDMX, México.

³Department of Anthropology and Archaeology Program, Boston University, 02215, United States of America.

⁴Departamento de Ciencias Ambientales y del Suelo, Instituto de Geología, UNAM, 06400, CDMX, México.

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Abstract

The Tlajinga Barrio is a domestic area situated in the south of Teotihuacan, Estado de México, where preserves original surface materials as well as buried archaeological structures are preserved. Original soil particles mixed with archaeological materials such as stone, stucco, ceramics, and mural fragments enrich the soil mainly with calcium carbonate, contributing to the increase in reflectance in different areas of the terrain, mainly in nearby areas where there were archaeological structures. This is recorded from a synoptic level by the modern remote sensors, with higher spectral, spatial, and radiometric resolution, correlating it to a smaller scale with soil micromorphology analysis. In this way, some minerals present in the floors and walls were identified, mainly the archaeological stucco now transformed into small particles of calcium carbonate. X-ray fluorescence (XFRF) and X-ray diffraction (XRD) complemented the results of remote sensing, spectrometry and micromorphology, identifying the elemental composition of soil particles and associated minerals, mainly calcium carbonate, that were used live in coatings on floors and buildings during the Teoti huacan era.

Key words: Remote sensing, micromorphology, spectroradiometry, x-ray fluorescence, x-ray diffraction.